At the SEMI CON Western Fair and Symposium in San Francisco, VEECO, an internationally renowned provider of precision instrumentation and metrology solutions, will showcase the structure of a new ContourGT(TM) optical surface analyzer that is optimized for high-performance testing. Brightness LED (HB-LED) strip sapphire substrate (substrate). The ContourGT-X8 PSS combines advanced contactless test capabilities with Veeco PSS metric hardware and software technology. Veeco also has a chip automation system developer's manual that provides tailor-made solutions for PSS quality assurance and quality control devices. High throughput and consistency are critical.
The ContourGT tester provides high throughput, non-invasive testing of PSS height, width, substrate curvature, thickness, and roughness. Can increase production and ensure LED efficiency and color consistency.
Dr. Mark R Munch, Executive Vice President, Veeco's Metrology and Instrumentation Division, said: "PSS is a key technology that improves efficiency and ensures uniform color for HBLEDs. This technology is in the ascendant. In HB-LED production, testing the shape on sapphire wafers Dimensionality and consistency are key steps. Now ContourGT-X8 PSS provides wafer suppliers and HB-LED equipment manufacturers with high-throughput and 3D surface measurement technology at an affordable price to increase throughput and ensure end products the quality of.
Ross Q. Smith, vice president and general manager of Veeco's optical industry metrology division, added: "We work closely with PSS wafer suppliers and HB-LED manufacturers to produce ContourGT-X8 PSS, ensuring that the product has sufficient width to meet The measurements we need. And we also work with mainstream wafer auto-suppliers such as CHAD Industries to offer HB-LED manufacturers a competitive price plan because they need a lot of freedom in their automation solutions. We hope The ContourGT-X8 PSS will be the industry's easy-to-use, all-weather, and efficient PSS surface metrology solution."
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